X-Ray Diffractometer (XRD) Laboratory
X-ray diffraction (XRD) is a powerful nondestructive technique for characterizing crystalline materials. It provides information on crystal structure, phase, preferred crystal orientation (texture), and other structural parameters, such as average grain size, crystallinity, strain, and crystal defects.
The Smartlab is highly configurable and allows for a variety of measurement types including theta/2-theta scans, pole figure measurements, small-angle diffraction, and more. Thermally controlled stage for both cryogenic and heated measurements is available. Specimens can be solids, powders, or thin films.
RIGAKU SMARTLAB TECHNICAL SPECIFICATIONS
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Maximum output power |
2 kW |
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Tube voltage and current |
40 kV, 30mA |
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Axis resolution |
0.0001° |
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Source |
Copper |
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Eulerian cradle |
χ: -5 to 95°/0.001° step |
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φ: -720 to 720°/0.002° step |
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Ζ: -4 to 1 mm/0.0005 mm step |
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Detektör |
D/teX Ultra 250 |
Particle Size Analyzer / Device: MALVERN MASTERSIZER 3000
The Malvern Mastersizer 3000 is a compact optical system that uses laser diffraction to measure particle size distribution for both wet and dry dispersions with minimum effort.
Measurement principle: Laser Diffraction
Application: Particle Size
Sample type: Dry powders, Suspensions, Colloids, Soils
Particle size range: 10nm to 3500µm
Typical measurement time: >10sec
