Scanning Electron Microscope (SEM) Laboratory

A scanning electron microscope (SEM) is a type of electron microscope that produces images of a sample by scanning the surface with a focused beam of electrons. The electrons interact with atoms in the sample, producing various signals that contain information about the surface topography and composition of the sample.

MAIA3 analytical scanning electron microscope produced by TESCAN company is used in our laboratory. The TESCAN MAIA3 is an ultra-high resolution SEM with excellent imaging capabilities in the whole range of beam energies. A versatile detection system and high spatial resolution allows the observation of even the finest surface details. This is an essential feature for comprehensive characterization of nanomaterials, for observation of beam-sensitive samples common in the semiconductor industry and for comfortable imaging of non-conductive samples including uncoated biological specimens.

Imaging up to 1,000,000X, secondary electrons (SE), backscattered electron (BSE) and X-ray analysis of elements down to carbon with energy dispersive X-ray spectroscopy (EDX) detector.

We also have Scanning Transmission Electron Microscopy in an SEM (STEM-in-SEM) and Electron backscatter diffraction (EBSD). STEM-in-SEM has become a popular technique for biologists, polymer scientists and materials scientists for its ease of use, cost effectiveness and high resolution. It is especially suited to investigating the internal structure of thin film (100-200nm) samples as well as size and shape of submicron to nanometer particles. EBSD is a scanning electron microscope–based microstructural-crystallographic characterization technique commonly used in the study of crystalline or polycrystalline materials. The technique can provide information about the structure, crystal orientation, phase, or strain in the material.